Lunch and Learn & Demos
Sign up for one of our Lunch and Learn sessions hosted by EDAX & TESCAN USA by clicking on the sign up link below. Complimentary lunch will be served, limited to 10 attendees.
Monday March 12th, 12:00 pm to 1:00 pm
The benefits of Variable Pressure Operation in the Scanning Electron Microscope
- Learn how to optimize charge balance with non conductive materials in the scanning electron microscope.
- Show the advantages of Energy Dispersive Xray Analysis in Variable Pressure Mode.
- Learn which detectors should be opitimized with certain materials.
With some materials If electrons accumulate on a nonconductive surface, the charge buildup causes a divergence of the electron beam and degrades the SEM image. In the variable-pressure SEM, some air is allowed into the sample chamber, and the interaction between the electron beam and the air molecules creates a cloud of positive ions around the electron beam. These ions will neutralize the negative charge from electrons collecting on the surface of a nonconductive material, whereby an analysis of the sample can be performed. This workshop will show that SEM imaging and EDS chemical analysis can be performed on nonconductive samples, uncoated, when the chamber pressure is maintained at a certain level.
Tuesday March 13th, 12:00 to 1:00 pm
Chemistry + Structure for Complete Characterization- hosted by EDAX
- Learn the basics of integrated EDS and EBSD collection
- Learn how to apply the technology to real world materials
- See firsthand how microstructure reveals information that is undiscovered by EDS alone
- Gain an understanding of the many applications of an integrated EDS-EBSD product
EDS technology is a proven technique for collecting chemical information about materials. When combined with EBSD, a full understanding of the physical microstructure can be attained. This leads to a complete and comprehensive microanalysis technique. Dynamic EDS and EBSD mapping allows real time data analysis while Smart Features guarantee optimized acquisition setup and data quality even for first time users.
Wednesday, March 14th, 12:00 pm to 1:00 pm
Wide Field Optics: The benefit of optical field of view in the Scanning Electron Microscope
- Basic Correlative Microscopy between light and electron imaging.
- Extreme Field View of Imaging with an Scanning Electron Microscope with a large image store.
- The advantages of Wide Field Optic Imaging in an SEM.
There are advantages of SEM over light microscopy including much higher magnification (>100,000X) and greater depth of field, up to 100 times that of light microscopy. This includes qualitative and quantitative chemical analysis information that can be obtained using an (EDS) spectrometer. This workshop will show how to correlate same areas of interest on the light microscope sample in the SEM and what advanatages this technique brings forth to the researcher.
In addition, we'll be hosting our popular Lunch and Learn series. Come by to hear more about our ability to handle large samples for EDS analysis. If you are interested in singing up for a session or a live demonstation sign-up below.
